作者: Amanda Generosi , Valerio Rossi Albertini , Gentilina Rossi , Giovanna Pennesi , Ruggero Caminiti
DOI: 10.1021/JP021846N
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摘要: The X-ray reflectrometry technique in its energy dispersive variant (EDXR) is utilized to study the morphological characteristics of dimeric ruthenium phthalocyanine (RuPc)2 thin films, which are being exploited as nitrogen oxide gas sensors. advantages EDXR with respect conventional (angular dispersive) counterpart discussed. high sensitivity this allowed us detect minimal variations films thickness and roughness a consequence exposure NO2 flux, providing information on diffusion process through film mechanisms interaction between molecules.