Laser damage resistance of ion-beam sputtered Sc2O3/SiO2 mixture optical coatings.

作者: Mathias Mende , Stefan Schrameyer , Henrik Ehlers , Detlev Ristau , Laurent Gallais

DOI: 10.1364/AO.52.001368

关键词:

摘要: We report on the correlation between laser damage resistance, optical and physical properties of Sc2O3/SiO2 mixture coatings. Several sets samples with ten different ratios have been prepared by ion-beam sputtering. The atomic compositions thin films are quantified employing x-ray photoelectron spectroscopy depth profiles. Laser-induced thresholds determined single subpicosecond pulses (500 fs) at 1030 nm. Furthermore, Son1 multishot measurements realized in ultraviolet wavelength range (355 nm) pulse durations 5 ns. In addition, influence two substrate polishing qualities radiation resistance composite is discussed.

参考文章(37)
Anne Marsden, Amy Shahtout, International Organization for Standardization American Society of Microbiology. pp. 447- 450 ,(2014) , 10.1128/9781555817282.CH22
D. Nguyen, L. A. Emmert, I. V. Cravetchi, M. Mero, W. Rudolph, M. Jupe, M. Lappschies, K. Starke, D. Ristau, TixSi1−xO2 optical coatings with tunable index and their response to intense subpicosecond laser pulse irradiation Applied Physics Letters. ,vol. 93, pp. 261903- ,(2008) , 10.1063/1.3050536
M. Alvisi, G. De Nunzio, D. Diso, M. R. Perrone, L. Protopapa, A. Rizzo, S. Scaglione, L. Vasanelli, Laser damage threshold of SiO2 films by the photoacoustic mirage technique Proceedings of the 10th international conference on photoacoustic and photothermal phenomena. ,vol. 463, pp. 512- 514 ,(1999) , 10.1063/1.58213
Mathias Mende, Lars O. Jensen, Henrik Ehlers, Werner Riggers, Holger Blaschke, Detlev Ristau, Laser-induced damage of pure and mixture material high reflectors for 355nm and 1064nm wavelength Proceedings of SPIE, the International Society for Optical Engineering. ,vol. 8168, pp. 816821- ,(2011) , 10.1117/12.897049
Guanghui Liu, Yunxia Jin, Hongbo He, Zhengxiu Fan, Effect of substrate temperatures on the optical properties of evaporated Sc2O3 thin films Thin Solid Films. ,vol. 518, pp. 2920- 2923 ,(2010) , 10.1016/J.TSF.2009.11.004
B. Mangote, L. Gallais, M. Zerrad, F. Lemarchand, L. H. Gao, M. Commandré, M. Lequime, A high accuracy femto-/picosecond laser damage test facility dedicated to the study of optical thin films Review of Scientific Instruments. ,vol. 83, pp. 013109- ,(2012) , 10.1063/1.3677324
Holger Blaschke, J’rgen Kohlhaas, Puja Kadkhoda, Detlev Ristau, DUV/VUV spectrophotometry for high-precision spectral characterization Laser-Induced Damage in Optical Materials: 2002 and 7th International Workshop on Laser Beam and Optics Characterization. ,vol. 4932, pp. 536- 543 ,(2003) , 10.1117/12.472387
Benoit Mangote, Laurent Gallais, Mireille Commandré, Mathias Mende, Lars Jensen, Henrik Ehlers, Marco Jupé, Detlev Ristau, Andrius Melninkaitis, Julius Mirauskas, Valdas Sirutkaitis, Simonas Kičas, Tomas Tolenis, Ramutis Drazdys, Femtosecond laser damage resistance of oxide and mixture oxide optical coatings Optics Letters. ,vol. 37, pp. 1478- 1480 ,(2012) , 10.1364/OL.37.001478
B. J. Pond, J. I. DeBar, C. K. Carniglia, T. Raj, Stress reduction in ion beam sputtered mixed oxide films Applied Optics. ,vol. 28, pp. 2800- 2805 ,(1989) , 10.1364/AO.28.002800
G. D. Cody, T. Tiedje, B. Abeles, B. Brooks, Y. Goldstein, Disorder and the Optical-Absorption Edge of Hydrogenated Amorphous Silicon Physical Review Letters. ,vol. 47, pp. 1480- 1483 ,(1981) , 10.1103/PHYSREVLETT.47.1480