作者: Miaolei Yan , Marc De Graef , Yoosuf N. Picard , Paul A. Salvador
DOI: 10.1063/1.4927201
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摘要: Electron channeling contrast imaging (ECCI) was used to characterize coherently strained La0.7Sr0.3MnO3 (LSM) films grown on (110)cubic-SrTiO3 (STO) and (100)orthorhombic-NdGaO3 (NGO). We focus the characterization of a relatively low density (1–3 μm/μm2) meandering loops (MLs) found in LSM film STO absent NGO. The MLs exhibit uniform variation from background strong dependence diffraction vector g. are quantitatively consistent with anti-phase boundaries (APBs) having displacement R=12[001]LSM. These APBs “double positioning” degeneracy tilted octahedra along [001]LSM untilted [001]STO. results highlight non-destructive capacity ECCI extended defects oxide films.