Interface diffusion and pyroelectric properties of Pb0.8La0.1Ca0.1Ti0.975O3/(Na0.85K0.15)0.5Bi0.5TiO3 hierarchical composite thin films
作者： Q.G. Chi , Y. Cui , C.H. Zhang , F.Y. Yang , Y. Chen
DOI: 10.1016/J.CERAMINT.2015.08.055
关键词:
摘要: Abstract Pb 0.8 La 0.1 Ca Ti 0.975 O 3 (PLCT)/(Na 0.85 K 0.15 ) 0.5 Bi TiO (NKBT) hierarchical composite thin films were fabricated by a sol–gel process. The interface diffusion and electrical properties of the investigated in detail. X-ray diffraction patterns indicated that PLCT/NKBT film annealed at 500 °C possessed perovskite structure; reflectivity measurements suggested no occurred 500 °C, which effectively decreased its dielectric constant. leakage current behavior ferroelectric pyroelectric then studied. lowest constant (142), low loss (0.029), highest coefficient (321 μC/m 2 K) films, resulted figure merit 158 μC/m K.
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