Dual three-dimensional and RF semiconductor devices using local SOI

作者: Jagar Singh , Srikanth Balaji Samavedam

DOI:

关键词:

摘要: Co-fabrication of a radio-frequency (RF) semiconductor device with three-dimensional includes providing starting structure, the structure including bulk silicon substrate, raised structure(s) coupled to substrate and surrounded by layer isolation material. Span(s) material between adjacent structures are recessed, epitaxial is created over recessed span(s) which another created. The RF device(s) fabricated on above material, creates local silicon-on-insulator, while can be structure(s).

参考文章(13)
Brian S. Doyle, Uday Shah, Been-Yih Jin, Method to fabricate adjacent silicon fins of differing heights ,(2008)
Shom Surendran Ponoth, Akira Ito, Changyok Park, Fin-shaped field effect transistor and capacitor structures ,(2013)
Veeraraghavan S. Basker, Effendi Leobandung, Tenko Yamashita, Xinhui Wang, DUAL EPITAXIAL INTEGRATION FOR FinFETS ,(2013)
Seung Hoon Sung, Ravi Pillarisetty, Marko Radosavljevic, Robert S. Chau, Sansaptak Dasgupta, Han Wui Then, Sherry R. Taft, Benjamin Chu-Kung, Sanaz K. Gardner, Iii-n devices in si trenches ,(2014)
Kangguo Cheng, Raghavasimhan Sreenivasan, Locally isolated protected bulk FinFET semiconductor device ,(2014)
Sang Lam, Hongmei Wang, S. Jagar, Mansun Chan, Design of Wide MOSFETs on Re-Crystallized Polysilicon Film with Multigigahertz Cut-Off Frequency european solid-state device research conference. pp. 279- 282 ,(2001) , 10.1109/ESSDERC.2001.195255
Sungjae Lee, Basanth Jagannathan, Shreesh Narasimha, Anthony Chou, Noah Zamdmer, Jim Johnson, Richard Williams, Lawrence Wagner, Jonghae Kim, Jean-Olivier Plouchart, John Pekarik, Scott Springer, Greg Freeman, Record RF performance of 45-nm SOI CMOS Technology international electron devices meeting. pp. 255- 258 ,(2007) , 10.1109/IEDM.2007.4418916
Julio C. Tinoco, Silvestre Salas Rodriguez, Andrea G. Martinez-Lopez, Joaquín Alvarado, Jean-Pierre Raskin, Impact of Extrinsic Capacitances on FinFET RF Performance IEEE Transactions on Microwave Theory and Techniques. ,vol. 61, pp. 833- 840 ,(2013) , 10.1109/TMTT.2012.2231697