Method and structure for testing embedded cores based system-on-a-chip

作者: Rochit Rajsuman , Hiroaki Yamoto

DOI:

关键词:

摘要: A method of testing embedded cores in an integrated circuit chip having a microprocessor core, memory core and other functional therein. The includes the steps of; forming plurality registers chip, by executing its instructions multiple times with pseudo random data evaluating results comparing simulation results, applying test program to generate pattern response function specific thereto resultant output signals cores.

参考文章(9)
Chongjun (June) Jiang, David A. Spilo, Robert D. Bryfogle, Bobby I. Pinkerton, Timothy J. Baldwin, Technique for incorporating a built-in self-test (bist) of a dram block with existing functional test vectors for a microprocessor ,(1997)
Peter Stewart Colyer, Cory Ansel Cherichetti, David Robert Stauffer, Test mode matrix circuit for an embedded microprocessor core ,(1995)
Luigi Ternullo, Garrett S. Koch, John Connor, Robert D. Adams, Stuart D. Rapoport, BIST tester for multiple memories ,(1995)
Steven F. Oakland, Robert L. Barry, John D. Chickanosky, Michael R. Ouellette, Serial input shift register built-in self test circuit for embedded circuits ,(1996)
Takeshi Kawashima, Hiroaki Tanaka, Integrated circuit having self-testing function ,(1994)