Semiconductor test apparatus having improved current load circuit

摘要: A semiconductor test apparatus including a current load circuit, by which ringing otherwise caused during high-speed digital can be prevented on both the overshoot and undershoot sides, is provided. In source circuit sink are associated with first switching voltage setting second respectively, set separately so that high low levels of signal waveform clamped to respective potentials clip in waveform. rectifying diode allows flow when about occur, occur.