Semiconductor device testing device
作者： Keiichi Sawada , Tetsuo Tada
DOI:
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摘要: A semiconductor device testing for a having input/output terminals includes dynamic load circuit provided each of the and comparator which compares voltage value obtained at terminal with predetermined to detect whether internal state is high impedance or not. The confirmation electrical connection between thereby conducted by comparator.
lens.org 参考文章(3)
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