Automatic test equipment with active load having high-speed inhibit mode switching

摘要: Automatic test equipment (ATE) for post-production testing of multi-pin integrated circuits (ICs). Each pin is assigned to a card having driver and an active load with the latter including both current source sink. The are connectable alternatively IC in response complementary inhibit signals. Within load, sink connected/disconnected by respective pairs matched transistor switch individual switches which activatable differential control means. Both each pair supplied from single source. One circuit pair, when activated, directs (from) pin, while other circuit, return line. All include Darligton-connected transistors additional draw base charge principal Darlington turned off.