Electric field stimulation setup for photoemission electron microscopes
作者： M. Buzzi , C. A. F. Vaz , J. Raabe , F. Nolting
DOI: 10.1063/1.4927825
关键词:
摘要: Manipulating magnetisation by the application of an electric field in magnetoelectric multiferroics represents a timely issue due to potential applications low power electronics and novel physics involved. Thanks its element sensitivity high spatial resolution, X-ray photoemission electron microscopy is uniquely suited technique for investigation coupling multiferroic materials. In this work, we present setup that allows situ magnetic fields while sample analysed microscope. As example performances setup, measurements on Ni/Pb(Mg(0.66)Nb(0.33))O3-PbTiO3 La(0.7)Sr(0.3)MnO3/PMN-PT artificial nanostructures.
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