Characterization of an argon microwave plasma torch coupled to a Mattauch–Herzog geometry mass spectrometer

作者: James H. Barnes IV , Ole A. Grøn , Gary M. Hieftje

DOI: 10.1039/B202201J

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摘要: An atmospheric pressure argon microwave plasma torch (MPT) ionization source was coupled to a Mattauch–Herzog +mass spectrometer (MHMS) for elemental analysis. The operating conditions of the Ar MPT-MHMS were optimized signal level, peak shape and resolution. background spectrum characterized, with most peaks arising from species that contain nitrogen. Detection limits in tens hundreds pptr range while sensitivities are 106 counts s−1 ppm−1 regime elements. major weakness isotope-ratio accuracy precision.

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