作者: Luiz F. Zagonel , Nicholas Barrett , Olivier Renault , Aude Bailly , Michael Bäurer
DOI: 10.1002/SIA.2886
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摘要: The surface composition of polycrystalline niobium-doped strontium titanate (SrTiO3: Nb) is studied using X-ray photoelectron emission microscopy (XPEEM) for many grain orientations in order to characterise the chemistry with high spatial resolution. sensitivity maximised by use soft synchrotron radiation (SR). orientation determined electron backscattering diffraction (EBSD). Stereographic plots are used show correlation between and several grains. Predominant terminations assigned major orientations. Copyright © 2008 John Wiley & Sons, Ltd.