Test method for semiconductor memory and its test system

摘要: PURPOSE:To easily recognize a defect occurring condition and to shorten time for analyzing by sampling defective bit relating specific mode. CONSTITUTION:Only mode specified setting means 4 is sampled out of bits LS11 detected tester 10 with measuring set 2 in address 3, sent display 5 distribution displayed, the recognized. And when discriminated range required informed 2, controller 11 sends signal test from power supply section 17 pattern generator 12 LS 11, read-out data compared write-in comparator 14, normal/defective discriminated. Thus, cause it occurrence can be performed quickly mixed modes clarifying object analyzed.