摘要: X-ray and neutron scattering represent the most important tools for structural analysis of condensed matter systems. By choosing glancing angles to surface, these methods also become as non-destructive probes surfaces, thin films, interfaces. While method surface x-ray has seen a rapid development in recent years parallel been much slower, part because opment lower flux available from nuclear reactors compared photon synchrotron sources. Only recently feasibility diffraction demonstrated. After, briefly describing method, examples film studies are discussed, future developments technique outlined.
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