作者: C. Daboo , M.J. Baird , H.P. Hughes , N. Apsley , M.T. Emeny
DOI: 10.1016/0040-6090(91)90150-V
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摘要: Abstract Measurements of reflectivity and photocurrent as a function angle incidence wavelength have been made for GaAsAlAsGaAsAu Schottky structure based on an Otto coupling geometry which allows incident p-polarized radiation to couple the surface plasmon (SP) mode at AuGaAs interface. At resonance, E fields associated with SP excitation are concentrated GaAsAu interface itself, enabling strong enhancement internal photoemission across barrier. Enhancement factors order 20 achieved. A direct comparison between resonant effects exciting junction itself outer Au-air has made. simple model in device indicates that excited photocarriers created gold film very short scattering length ϐ ≈ 10 nm, emphasizes importance