作者: Nurbaya Zainal , Mohamad Rusop
DOI: 10.4028/WWW.SCIENTIFIC.NET/AMR.1109.466
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摘要: The most important thing in preparing thin films ceramic material such lead titanate, PbTiO3 is the behavioral of microstructural changes due to applying heat treatment during crystallization process. In general, imperfection surface morphology as porosity, grain boundaries, existence microcrack films, out-diffusion and others are caused by this factor, transfer element found very interesting be discussed towards next electrical characterization. However, present study only focuses on that observed both field emissions scanning electron microscopy (FESEM) atomic force (AFM). details measurement for observation will explained later. preparation were done trough simple sol-gel spin coating method deposited ITO coated glass substrate.