Scanning Force Microscopy: With Applications To Electric, Magnetic, And Atomic Forces
作者： Dror Sarid
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摘要: PART ONE: LEVERS AND NOISE 1. Mechanical properties of levers 2. Resonance enhancement 3. Sources noise TWO: SCANNING FORCE MICROSCOPES 4. Tunneling detection systems 5. Capacitance 6. Homodyne 7. Heterodyne 8. Laser-Diode feedback 9. Polarization 10. Deflection THREE: MICROSCOPY 11. Electric force microscopy 12. Magnetic 13. Atomic References Index
amazon.com参考文章(2)
G. Binnig, Scanning tunneling microscopy Helvetica Physica Acta. ,vol. 55, pp. 726- 735 ,(1982)
G. Binnig, C. F. Quate, Ch. Gerber, Atomic force microscope Physical Review Letters. ,vol. 56, pp. 930- 933 ,(1986) , 10.1103/PHYSREVLETT.56.930