作者: Xiang Lu , S. Sundar Kumar Iyer , Chenming Hu , Nathan W. Cheung , Jing Min
DOI: 10.1063/1.120127
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摘要: We report the implementation of ion-cut silicon-on-insulator (SOI) wafer fabrication technique with plasma immersion ion implantation (PIII). The hydrogen rate, which is independent size, considerably higher than that conventional implantation. simple PIII reactor setup and its compatibility cluster-tools offer other process optimization opportunities. feasibility demonstrated by successful SOI structures. can be optimized so only one species dominant. performing using helium also demonstrated.