作者: Thomas F Kelly , David J Larson
DOI: 10.1016/S1044-5803(99)00055-8
关键词:
摘要: The historical developments leading to the advent of Local Electrode Atom Probes (LEAP) are reviewed. An assessment state art is made, and major advantages LEAPs over conventional atom probes described. best implementations these concepts remaining challenges for realization LEAP's potential also It concluded that should be an important tool materials characterization at atomic scale. Modern materials-dependent industries as diverse steel microelectronics benefit from this technology.