Quantitative SIMS analysis of GSJ rock reference samples.
作者： Hisayoshi Yurimoto , Aya Yamashita , Norimasa Nishida , Shigeho Sueno
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摘要: Quantitative micro-analysis of silicate glasses has been developed using secondary ion mass spectrometry (SIMS). The standard rock references, issued by the Geological Survey Japan (GSJ), were fused into glass beads and used as standards for SIMS analysis. Thirty eight elements at major, minor trace concentration levels, analyzed simultaneously on an energy-filtering technique. In range standards, linear relationships established following elements: Li, Be, B, Na, Mg, Al, P, K, Ca, Sc, Ti, V, Cr, Mn, Fe, Co, Cu, Rb, Sr, Y, Zr, Cs, Ba, La, Ce, Pr, Nd, Sm, Eu, Gd, Tb, Dy, Ho, Er, Tm, Yb, Lu Hf. typical accuracy analyses are within 10% recommended values GSJ over 1 ppm.
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