Leakage current behavior in lead-free ferroelectric (K,Na)NbO3-LiTaO3-LiSbO3 thin films
作者： M. Abazari , A. Safari
DOI: 10.1063/1.3531575
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摘要: Conduction mechanisms in epitaxial (001)-oriented pure and 1 mol % Mn-doped (K0.44,Na0.52,Li0.04)(Nb0.84,Ta0.1,Sb0.06)O3 (KNN-LT-LS) thin films on SrTiO3 substrate were investigated. Temperature dependence of leakage current density was measured as a function applied electric field the range 200–380 K. It shown that different transport dominate films. In films, Poole-Frenkel emission found to be responsible for leakage, while Schottky dominant mechanism at higher fields. This is remarkable yet clear indication effect Mn resistive behavior such
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