摘要: Automated electron backscatter diffraction (EBSD) or orientation imaging microscopy (OIM) has become a common analytical tool for the statistical characterisation of grain boundaries in polycrystalline materials. However, as such studies have more tractable with advances EBSD technology some critical complexities boundary analysis been neglected. This includes multidimensionality boundaries, correlated versus uncorrelated misorientation distributions, OIM scanning artefacts specifically to analysis. The present work describes these shortfalls well approaches mitigating problems via EBSD.