Phase differentiation via combined EBSD and XEDS

作者: M. M. Nowell , S. I. Wright

DOI: 10.1111/J.0022-2720.2004.01299.X

关键词: MicroscopyCrystal structureDiffractionMaterials sciencePhase (matter)Biological systemMicrostructureElectron backscatter diffractionOrientation (computer vision)Characterization (materials science)Optics

摘要: Summary Electron backscatter diffraction (EBSD) and orientation imaging microscopy have become established techniques for analysing the crystallographic microstructure of single multiphase materials. In certain instances, however, it can be difficult and/or time intensive to differentiate phases within a material by crystallography alone. Traditionally list candidate is specified prior data collection. The information extracted from patterns then compared with these phases, best-fit match determined. Problems may arise when two similar crystal structures. phase differentiation process improved collecting chemical through X-ray energy-dispersive spectroscopy (XEDS) simultaneously EBSD using pre-filter candidates. This technique improves both overall speed collection accuracy final characterization. Examples this limitations involved will presented discussed.

参考文章(9)
KRIEGER LASSEN, Source point calibration from an arbitrary electron backscattering pattern Journal of Microscopy. ,vol. 195, pp. 204- 211 ,(1999) , 10.1046/J.1365-2818.1999.00581.X
David P. Field, Recent advances in the application of orientation imaging Ultramicroscopy. ,vol. 67, pp. 1- 9 ,(1997) , 10.1016/S0304-3991(96)00104-0
Stuart I. Wright, Brent L. Adams, Automatic analysis of electron backscatter diffraction patterns Metallurgical and Materials Transactions A-physical Metallurgy and Materials Science. ,vol. 23, pp. 759- 767 ,(1992) , 10.1007/BF02675553
Paul G. Kotula, Michael R. Keenan, Joseph R. Michael, Automated analysis of SEM X-ray spectral images: a powerful new microanalysis tool. Microscopy and Microanalysis. ,vol. 9, pp. 1- 17 ,(2003) , 10.1017/S1431927603030058
Jae Won Lee, Zuhair A. Munir, Masachika Shibuya, Manshi Ohyanagi, Synthesis of Dense TiB2‐TiN Nanocrystalline Composites through Mechanical and Field Activation Journal of the American Ceramic Society. ,vol. 84, pp. 1209- 1216 ,(2004) , 10.1111/J.1151-2916.2001.TB00818.X
Saul A. Teukolsky, Brian P. Flannery, William T. Vetterling, William H. Press, Numerical recipes in C Cambridge University Press. ,(1994)
Matithew M. Nowell, David P. Field, Texture and Grain Boundary Structure Dependence of Hillock Formation in Thin Metal Films MRS Proceedings. ,vol. 516, ,(1998) , 10.1557/PROC-516-115
Brough I, Humphreys Fj, High resolution electron backscatter diffraction with a field emission gun scanning electron microscope. Journal of Microscopy. ,vol. 195, pp. 6- 9 ,(1999)
Raymond P. Goehner, Joseph R. Michael, Charles R. Hills, Martin J. Carr, Analysis of SEM Electron Backscattered Kikuchi Patterns Using a CCD Detector and a Macintosh Computer Proceedings, annual meeting, Electron Microscopy Society of America. ,vol. 50, pp. 1310- 1311 ,(1992) , 10.1017/S0424820100131188