Quantitative XPS: The calibration of spectrometer intensity—energy response functions. 2—Results of interlaboratory measurements for commercial instruments
作者： M. P. Seah , M. E. Jones , M. T. Anthony
关键词:
摘要: Deux methodes d'evaluation de la fonction reponse sont testees: mesure surface des pics et les donnees fond spectres feuilles Cu, Ag Au
sci-hub.se 参考文章(22)
D W O Heddle, A comparison of the étendue of electron spectrometers Journal of Physics E: Scientific Instruments. ,vol. 4, pp. 589- 592 ,(1971) , 10.1088/0022-3735/4/8/009
M. P. Seah, The quantitative analysis of surfaces by XPS: A review Surface and Interface Analysis. ,vol. 2, pp. 222- 239 ,(1980) , 10.1002/SIA.740020607
J.H. Scofield, Hartree-Slater subshell photoionization cross-sections at 1254 and 1487 eV Journal of Electron Spectroscopy and Related Phenomena. ,vol. 8, pp. 129- 137 ,(1976) , 10.1016/0368-2048(76)80015-1
H.G. Nöller, H.D. Polaschegg, H. Schillalies, A step towards quantitative electron spectroscopy measurements by improved electron optics Journal of Electron Spectroscopy and Related Phenomena. ,vol. 5, pp. 705- 723 ,(1974) , 10.1016/0368-2048(74)85047-4
M. Schärli, J. Brunner, Experimental study of the energy dependence of transmission in photoelectron spectrometers Journal of Electron Spectroscopy and Related Phenomena. ,vol. 31, pp. 323- 334 ,(1983) , 10.1016/0368-2048(83)85080-4
C. D. Wagner, Factors affecting quantitative determinations by x-ray photoelectron spectroscopy Analytical Chemistry. ,vol. 49, pp. 1282- 1290 ,(1977) , 10.1021/AC50017A003
Stephen Evans, Robin G. Pritchard, John M. Thomas, Relative differential subshell photoionisation cross-sections (MgKα) from lithium to uranium Journal of Electron Spectroscopy and Related Phenomena. ,vol. 14, pp. 341- 358 ,(1978) , 10.1016/0368-2048(78)80008-5
D. A. Shirley, High-Resolution X-Ray Photoemission Spectrum of the Valence Bands of Gold Physical Review B. ,vol. 5, pp. 4709- 4714 ,(1972) , 10.1103/PHYSREVB.5.4709
C. D. Wagner, L. E. Davis, M. V. Zeller, J. A. Taylor, R. H. Raymond, L. H. Gale, Empirical atomic sensitivity factors for quantitative analysis by electron spectroscopy for chemical analysis Surface and Interface Analysis. ,vol. 3, pp. 211- 225 ,(1981) , 10.1002/SIA.740030506
M Vulli, K Starke, Experimental determination of the analyser brightness of a photoelectron spectrometer. Journal of Physics E: Scientific Instruments. ,vol. 10, pp. 158- 160 ,(1977) , 10.1088/0022-3735/10/2/013