Martin Seah
机构: National Physical Laboratory
每年引用次数
引用次数
引用: 39,392
H-指数: 76
I10-指数 : 267
出版物: 451
Accurate thickness measurements in thin films with surface analysis.
M. P. Seah
Journal of Surface Analysis 12 ( 2) 70 -77
1
2005
Auger and x-ray photoelectron spectroscopy
M. P. Seah , D. Briggs
Wiley , Salle , Sauerlander
331
1990
Intergranular regregation phenomena studied by AES
M. P. Seah
Journal de microscopie et de spectroscopie électroniques 8 ( 3) 177 -191
1983
SECTION 6.2 SURFACE TOPOGRAPHY ANALYSIS
Leonardo De Chiffre , M. P. Seah
2005
Long term intensity stability of Auger electron spectrometers: Instructions for the interlaboratory comparison
M. P. Seah , G. C. Smith
STIN 90 22027
1989
Relative intensity-energy calibration of X-ray photoelectron spectrometers: Instructions for the use of reference materials SCAA83
M. T. Anthony , M. P. Seah
STIN 86 21813
1985
Optimisation and specification of Auger electron spectrometers for signal-to-noise ratio performance
M. P. Seah , C. P. Hunt
STIN 94 17549
1993
Static SIMS inter-laboratory study
I. S. Gilmore , M. P. Seah
Surface and Interface Analysis 29 ( 9) 624 -637
22
2000
Sputter-induced cone and filament formation on InP and AFM tip shape determination
M. P. Seah , S. J. Spencer , P. J. Cumpson , J. E. Johnstone
Surface and Interface Analysis 29 ( 11) 782 -790
14
2000
Surface segregation and its relation to grain boundary segregation
M. P. Seah , Colin Lea
Philosophical Magazine 31 ( 3) 627 -645
205
1975
Kinetics of surface segregation
Colin Lea , M. P. Seah
Philosophical Magazine 35 ( 1) 213 -228
224
1977
Determination of the sputtering yield of cholesterol using Arn+ and C60+(+) cluster ions
P. D. Rakowska , M. P. Seah , J.-L. Vorng , R. Havelund
Analyst 141 ( 16) 4893 -4901
1
2016
Scattering in electron spectrometers, diagnosis and avoidance. II. Cylindrical mirror analysers
M. P. Seah
Surface and Interface Analysis 20 ( 11) 876 -890
12
1993
Scattering in electron spectrometers, diagnosis and avoidance. I. Concentric hemispherical analysers
M. P. Seah
Surface and Interface Analysis 20 ( 11) 865 -875
17
1993
Simple method of depth profiling (stratifying) contamination layers, illustrated by studies on stainless steel
M. P. Seah , J. H. Qiu , P. J. Cumpson , J. E. Castle
Surface and Interface Analysis 21 ( 6-7) 336 -341
66
1994
Comment on ‘neglected and hidden errors in the quantification of Auger electron spectroscopy’ by J. du plessis (Surf. Interface Anal. 20, 228 (1993))
M. P. Seah
Surface and Interface Analysis 21 ( 8) 587 -589
2
1994
Static SIMS: Surface Charge Stabilization of Insulators for Highly Repeatable Spectra when using a Quadrupole Mass Spectrometer.
I. S. Gilmore , M. P. Seah
Surface and Interface Analysis 23 ( 4) 191 -203
14
1995
Fluence, flux, current and current density measurement in faraday cups for surface analysis
I. S. Gilmore , M. P. Seah
Surface and Interface Analysis 23 ( 4) 248 -258
14
1995
Effective dead time in pulse counting systems
M. P. Seah
Surface and Interface Analysis 23 ( 10) 729 -732
23
1995
Quantitative AES: determination of the effects of the relative orientations of the sample, electron gun and spectrometer on the direct spectrum shape for the establishment of standard reference spectra
G. C. Smith , M. P. Seah
Surface and Interface Analysis 14 ( 12) 823 -834
27
1989