Effective dead time in pulse counting systems

摘要: Dead time corrections in particle counting systems are important for quantitative analysis. It is often not appreciated, however, that these depend on the experiment performed. For surface analysis using a stationary beam and steady rate from spectrometer with single detecting electronics, dead lead to simple equations discussed our earlier work. These concepts translate very directly into SIMS AES rastered beams SIMS, XPS multidetectors, use same equations, but area average multidetector times, respectively. The relations of times original electronic presented here.