Separation and identification of phases with through-focus dark-field electron microscopy

摘要: Abstract The use of out-of-focus dark-field images combined with stereoviewing to obtain more information than is available from a single image and its corresponding diffraction pattern, has been demonstrated recently. In this technique, called through-focus electron microscopy, an artificial stereo-image effect can be produced by utilizing the shifts in images. technique basically involves obtaining two beam-tilted images, selecting several spots objective aperture, such that one slightly over-focus other under-focus. Examination through conventional stereoviewer produces elevation differences between regions contributing chosen aperture. These are unrelated object positions thin foil, no specimen tilting required. Applications rapid separation identification phases complex al...