Scanning electron microscopic investigation of the smeared layer on root canal walls.

作者: Carson L. Mader , J. Craig Baumgartner , Donald D. Peters

DOI: 10.1016/S0099-2399(84)80204-6

关键词:

摘要: The scanning electron microscope was used to investigate the morphological characteristics of smeared layer on walls root canals that had been instrumented with K-type files and irrigated a 5.25% solution NaOCl. material examined from two perspectives. First, “look down onto” covering canal wall. Second, looked at side or profile view. This done by using scan junction between fractured dentinal tubules surface found consist confluent components; wall which packed into some tubules. typically about 1- 2-μm thick. depth tubular packing varied few micrometers up 40 μm.

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