A Random and an Algorithmic Technique for Fault Detection Test Generation for Sequential Circuits
作者： M.A. Breuer
关键词:
摘要: Two procedures are presented for generating fault detection test sequences large sequential circuits. In the adaptive random procedure one can achieve a tradeoff between generation time, length, and percent of circuit tested. An algorithmic path-sensitizing is also presented. Both employ three-valued logic system. Some experimental results given.
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