作者: Takuya Ozaki , Yoshinori Takagi , Junichi Nishinaka , Mitsuru Funato , Yoichi Kawakami
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摘要: ScAlMgO4 (SCAM) (0001) can be used for metalorganic vapor phase epitaxy (MOVPE) of GaN and lattice-matched In0.17Ga0.83N. grown on SCAM(0001) via a low-temperature buffer layer shows excellent structural quality, indicating that the GaN-SCAM interface is stable during MOVPE. For InGaN SCAM(0001), at lower temperature effectively improves surface luminescence uniformity. The nearly unstrained exhibits photoluminescence peaking 505 nm room temperature. These achievements indicate In0.17Ga0.83N/SCAM templates may pave way toward longer-wavelength light-emitting -detecting devices using with higher In contents.