A Resonance Method for the Broad-Band Characterization of General Two-Port Microstrip Discontinuities
作者： V. Rizzoli , A. Lipparini
DOI: 10.1109/TMTT.1981.1130424
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摘要: The paper describes an experimental procedure suitable for broad-band characterization of two-port microstrip discontinuities any topology. resonance frequencies a transmission-type cavity embedding the discontinuity under test and set reference fines are measured computer processed to obtain scattering parameters itself. This method features extreme ease application thanks limited number simple topology required samples, as well highly accurate repeatable results. Furthermore, matrices obtained from measurement automatically normalized with respect wave impedances qnasi-TEM modes in outgoing microstrips. makes possible analysis design approach not requiring knowledge or calculation characteristic impedances.
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