EXAFS studies of novel impulsive hardening in the Be–Zn–Se semiconductor alloys

摘要: Beryllium doping has been used to harden the inherently soft zinc-selenides semiconductor mixed alloys. Stoichiometric ternary alloys of BexZn1-xSe have synthesized by Bridgeman technique. Extended X-ray absorption fine structure (EXAFS) spectroscopy — in a state-of-art synchrotron-based method is performed varying dopant Be concentration from 6% 55% zinc–selenide host semiconductor. EXAFS analyses carried out study next neighbor and nearest atomic positions, nature substitutional doping, extent bond length homogeneity, presence involuntary contrast among path distances, cross over hard character on increasing concentration. Our results indicate an impulsive hardening with disparity at lower higher levels. The observation dopants lattice explained help self-accommodative attributes lattice.