Auger electron spectroscopy, ellipsometry and photoluminescence investigations of Zn1−XBeXSe alloys

作者: A. Bukaluk , A.A. Wronkowska , A. Wronkowski , H. Arwin , F. Firszt

DOI: 10.1016/S0169-4332(01)00108-8

关键词:

摘要: Abstract In this paper, properties of the Zn 1− X Be Se crystals grown from melt by high-pressure Bridgman method are reported. Spectroscopic ellipsometry has been used for determination complex dielectric function Se. On basis photon energy dependence function, gaps alloys containing different beryllium concentrations have evaluated. Measurements photoluminescence (PL) spectra allowed to find excitonic gap in investigated alloys. Auger electron spectroscopy (AES) with simultaneous argon ion sputtering surface composition. AES investigations make predictions concerning distribution particular elements samples.

参考文章(21)
F. Firszt, S. Łęgowski, H. Męczyńska, B. Sekulska, J. Szatkowski, J. Zakrzewski, W. Paszkowicz, PHOTOLUMINESCENCE AND PHOTOACOUSTIC INVESTIGATIONS OF BERYLLIUM AND MAGNESIUM CONTAINING WIDE GAP II-VI MIXED CRYSTALS Acta Physica Polonica A. ,vol. 95, pp. 991- 996 ,(1999) , 10.12693/APHYSPOLA.95.991
H. Jeon, J. Ding, A. V. Nurmikko, W. Xie, D. C. Grillo, M. Kobayashi, R. L. Gunshor, G. C. Hua, N. Otsuka, Blue and green diode lasers in ZnSe‐based quantum wells Applied Physics Letters. ,vol. 60, pp. 2045- 2047 ,(1992) , 10.1063/1.107109
A. Waag, F. Fischer, K. Schüll, T. Baron, H.-J. Lugauer, Th. Litz, U. Zehnder, W. Ossau, T. Gerhard, M. Keim, G. Reuscher, G. Landwehr, Laser diodes based on beryllium-chalcogenides Applied Physics Letters. ,vol. 70, pp. 280- 282 ,(1997) , 10.1063/1.118422
S. Taniguchi, T. Hino, S. Itoh, K. Nakano, N. Nakayama, A. Ishibashi, M. Ikeda, 100h II-VI blue-green laser diode Electronics Letters. ,vol. 32, pp. 552- 553 ,(1996) , 10.1049/EL:19960415
F Firszt, H Meczynska, B Sekulska, J Szatkowski, W Paszkowicz, J Kachniarz, Composition dependence of the unit cell dimensions and the energy gap in Zn1-xMgxSe crystals Semiconductor Science and Technology. ,vol. 10, pp. 197- 200 ,(1995) , 10.1088/0268-1242/10/2/013
R. M. A. Azzam, Stanley S. Ballard, N. M. Bashara, Ellipsometry and polarized light ,(1977)
P.M. Hall, J.M. Morabito, Matrix effects in quantitative auger analysis of dilute alloys Surface Science. ,vol. 83, pp. 391- 405 ,(1979) , 10.1016/0039-6028(79)90052-9
Hans Arwin, Jan Mårtensson, Roger Jansson, Line-shape analysis of ellipsometric spectra on thin organic films. Applied Optics. ,vol. 31, pp. 6707- 6715 ,(1992) , 10.1364/AO.31.006707
John P. Walter, Marvin L. Cohen, Y. Petroff, M. Balkanski, Calculated and Measured Reflectivity of ZnTe and ZnSe Physical Review B. ,vol. 1, pp. 2661- 2667 ,(1970) , 10.1103/PHYSREVB.1.2661