Line-shape analysis of ellipsometric spectra on thin organic films.
作者： Hans Arwin , Jan Mårtensson , Roger Jansson
DOI: 10.1364/AO.31.006707
关键词:
摘要: A methodology for the line-shape analysis of ellipsometric spectra on thin (< 200-A) organic films is presented. Four different line shapes are employed: Gaussian, Lorentzian, phase-relaxed and a critical-point shape. An analytic data addresses problem modeling unsymmetric absorption bands. The method exemplified by an phthalocyanine poly(3-hexylthiophene), we show that number type resonances in band can be obtained. possibility resolving cause shift peak position also demonstrated. In case being studied due to redistribution oscillator strengths between individual not shifts energies resonances.
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