Unambiguous determination of thickness and dielectric function of thin films by spectroscopic ellipsometry
作者： H. Arwin , D.E. Aspnes
DOI: 10.1016/0040-6090(84)90019-1
关键词: Critical point (mathematics) 、 Thin film 、 Range (particle radiation) 、 Condensed matter physics 、 Dielectric 、 Monolayer 、 Function (mathematics) 、 Materials science 、 Sensitivity (control systems) 、 Optics 、 Substrate (electronics)
摘要: … 5(a) we show the second derivative of (a,) with respect to E for the pyrrole film for different values of (d). We see immediately that the gold-derived spectral feature at 2.5 eV can be …
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