Thin films of poly(3-hexylthiophene) studied with spectroscopic ellipsometry
作者： R. Jansson , H. Arwin , G. Gustafsson , O. Inganäs
DOI: 10.1016/0379-6779(89)90548-1
关键词: Thin film 、 Degradation (geology) 、 Second derivative 、 Range (particle radiation) 、 Analytical chemistry 、 Materials science 、 Absorption (electromagnetic radiation) 、 Spinning 、 Photon energy 、 Polymer
摘要: Abstract We have used spectroscopic ellipsometry in the photon energy range 1.5–2.5 eV to determine dielectric function of thin films (3–30nm) undoped poly(3-hexylthiophene) prepared with a spinning technique on gold substrates. observed characteristic absorption peaks 2–2.5 eV. By means second derivative lineshape fitting, we demonstrate that it is possible quantitatively extract values model parameters like peak energies, linewidths and oscillator strengths. also show how light-induced degradation changes polymer as reflected response polymer.
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