A REVIEW OF FT-IR DIFFUSE REFLECTION SAMPLING CONSIDERATIONS

作者: M. Milosevic , S. L. Berets

DOI: 10.1081/ASR-120016081

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摘要: ABSTRACT Diffuse reflectance is widely used for examining rough surfaced materials, samples abraded on substrates, powder, and reactions powders. A variety of sampling methods are diffuse analysis. It important to understand the theoretical constraints correctly interpret data qualitative or quantitative applications. This article reviews most commonly theory discusses its limitations relative various sample handling commercially available accessories.

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