Scanning Near-Field Optical Microscopes for High Resolution Imaging
作者： Th. Lacoste , Th. Huser , H. Heinzelmann , H.-J. Güntherodt
DOI: 10.1007/978-94-011-0423-4_9
关键词:
摘要: We have constructed two scanning near-field optical microscopes (SNOM) for imaging with resolutions exceeding Rayleigh’s diffraction limit. One instrument is of the aperture-SNOM type and equipped shear-force feedback probe to sample distance control. Combined a conventional light microscope easy location, this well suited investigation biological materials. The second relies on tunneling (STOM) from beam totally reflected at sample/air interface into force tip. combination microscopy allows correlation properties surface structure. Microfabricated test structures been imaged.
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