作者: D. Courjon , K. Sarayeddine , M. Spajer
DOI: 10.1016/0030-4018(89)90297-6
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摘要: For overpassing the classical limit of resolution in optical microscopy, it is necessary to detect light diffracted from small objects near field and not far as microscopy. A particular case detection evanescent lying on surface a guiding structure. These waves interact with object details then can be used for determining topography object. The main problem because beam confined surface. solution consists frustrating by means dielectric probe. conversion inhomogeneous into homogeneous ones fundamentally similar electronic tunneling effect. Subwavelength obtained placing suitable stylus connected an fibre xyz piezo-electric micropositioning system allows scan under test.