Characteristics of Dielectric-clad Directional Couplers for Improved Edge Coupling to Hybrid Detectors

摘要: Active components on glass and lithium niobate substrates have been fabricated by combining passive waveguides with an overlay of grafted semiconductor material for optical detection applications1. To improve the overall coupling from fiber to detector, a vertical directional coupler that transfers power buried waveguide (with minimal insertion loss) surface was recently proposed demonstrated using field- assisted K+-ion exchange in glass2. Though this scheme works well light its efficiency is impaired presence thin layer low index amorphous at semiconductor/waveguide bonding interface3. An effective way avoid problem use edge detector which can be achieved cladding waveguide/detector structure dielectric film refractive higher than waveguide4. Here, we report preliminary results fabrication measurement clad sputtered Corning 7059 take advantage scheme. In addition, compare experimental theoretical obtained finite-difference vector beam propagation method5 (FD-VBPM).