RASOR: An advanced instrument for soft x-ray reflectivity and diffraction
作者： S. S. Dhesi , T. A. W. Beale , G. van der Laan , P. D. Hatton , P. Steadman
DOI: 10.1063/1.3458004
关键词:
摘要: We report the design and construction of a novel soft x-ray diffractometer installed at Diamond Light Source. The beamline endstation RASOR is constructed for general users designed primarily study single crystal diffraction thin film reflectivity. instrument comprised limited three circle (θ, 2θ, χ) with an additional removable rotation (ϕ) stage. It equipped liquid helium cryostat, post-scatter polarization analysis. Motorized motions are provided precise positioning sample onto center rotation, beam. functions have been tested Source, initial test measurements provided, demonstrating potential instrument.
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