Complete polarization analysis of an APPLE II undulator using a soft X-ray polarimeter.
作者： Hongchang Wang , Peter Bencok , Paul Steadman , Emily Longhi , Jingtao Zhu
DOI: 10.1107/S0909049512034851
关键词:
摘要: Two APPLE II undulators installed on the Diamond I10 beamline have all four magnet arrays shiftable and thus can generate linear polarization at any arbitrary angle from 0° to 180°, as well other states of elliptical polarization. To characterize emitted radiation state one undulator, complete measurement was performed using a multilayer-based soft X-ray polarimeter. The results appear show that offset is about 6° compared with measurements 712 eV, equivalent an undulator jaw phase 1.1 mm. In addition, various ellipticities also been measured function row phase.
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