Simulation of multiple-bit soft errors induced by cosmic ray neutrons in DRAMs
作者： Y. Tosaka , S. Satoh
DOI: 10.1109/SISPAD.2000.871259
关键词:
摘要: Although it has been shown that cosmic ray neutrons play an important role in soft error (SE) phenomena, some issues neutron-induced SE phenomena are still to be clarified. In this paper, multiple-bit SEs 16 Mb DRAMs investigated numerically using the Neutron-Induced Soft Error Simulator (NISES), and simulated results compared experimental data. Scaling effects on SEs, of configuration patterns double-bit rates, influence correction code discussed.
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