作者: Andrew R. Davis , Lorelle N. Pye , Noam Katz , Janice A. Hudgings , Kenneth R. Carter
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摘要: Charge-modulated optical spectroscopy is used to achieve dynamic two-dimensional mapping of the charge-carrier distribution in poly(3-hexylthiophene) thin-film transistors. The resulting in-channel distributions evolve from uniformly symmetric asymmetrically saturated as devices are increasingly biased. Furthermore, physical, chemical, and electrical defects spatially resolved cases where their presence not obvious device performance.