作者: Jun’ya Tsutsumi , Satoshi Matsuoka , Toshikazu Yamada , Tatsuo Hasegawa
DOI: 10.1016/J.ORGEL.2015.06.047
关键词:
摘要: Abstract We report on the application of gate-modulation (GM) imaging technique in rapid and collective inspection organic thin-film transistor (OTFT) array operations. The method allows visualizing charge carriers accumulated OTFT by time-translational differential image sensing with use a coupled device (CCD) sensor. feature makes it possible to visualize dead pixels, broken channels, or distributed performance array. discuss how correlate spectroscopic information GM signal this arrays.