作者: Z. Laghfour , T. Ajjammouri , S. Aazou , S. Refki , D. V. Nesterenko
DOI: 10.1007/S10854-015-3277-8
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摘要: Transparent and conductive aluminum-doped zinc oxide (AZO) thin films with high preferential c-axis orientation have been deposited on glass substrates by radio frequency magnetron sputtering method of ZnO DC Al. Structural, surface morphology, optical electrical properties were studied X-ray diffraction, scanning electron microscope, ultraviolet–visible spectrophotometer, plasmon spectroscopy Hall effect measurements. The results show that AZO are polycrystalline exhibit the hexagonal wurzite crystal structure a preferred along (002) direction. When power supplied to Al target increases, crystallinity decreases while resistivity increases. average measured transmittance exceeded 75 % in visible range for all films. band gap values increase decreasing concentrations.