X-ray Photoelectron Spectroscopy Investigations of Acid-Base Interactions in Adhesion

作者: John F. Watts , Mohamed M. Chehimi

DOI: 10.1080/00218469308026555

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摘要: Abstract A qualitative scale of polymer basicity has been obtained using X-ray photoelectron spectroscopy (XPS). The method is based on the uptake sodium cations (Na+) by polymeric films cast onto glass slides containing oxide. diffusion Na+ from substrate to polymers interpreted in terms acid-base interactions between (Lewis acid) and a series basic polymers; poly(styrene) (PS), poly(methylmethacrylate) (PMMA), poly(ethylene oxide) (PEO), acidic poly(vinyl butyral) (PVB), chloride) (PVC), poly(vinylidene fluoride) (PVdF). concentration determined XPS consistently higher polymers. By comparing different we have following decreasing order basicity: PS>PMMA>PEO>PVB>PVC>PVdF. An extension this approach, relate relative uptakes hardness or softness polymers, also considered.

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