作者: Trung T. Doan
DOI:
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摘要: Disclosed is a method of etching back tungsten layer on semiconductor wafer by polishing process. The comprises: exposing the to be polished solution at preselected temperature, comprising an oxidizing component which oxidizes oxide; mechanically oxide from and into solution; also dissolution selected group consisting KOH NH 4 OH or mixture thereof, being substantially dissoluted in solution.