作者: Anamul H. Mir , J. A. Hinks , Jean-Marc Delaye , Sylvain Peuget , S. E. Donnelly
DOI: 10.1038/S41598-018-33556-Y
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摘要: Estimates of noble gas solubility in glasses and minerals are important to understand the origin these gases, particularly xenon, atmosphere. However, technical difficulties ambiguities quantifying dissolved gases introduce large uncertainties estimates. We present here use transmission electron microscopy (TEM) with in-situ ion implantation as a non-equilibrium approach for Using suitable Xe equation state Monte-Carlo simulations TEM images, clear distinction between filled precipitates empty voids is made. Furthermore, implantation-induced changes estimated using molecular dynamics simulations. These studies allow us evaluate xenon irradiated pristine silica monitor diffusion-mediated — otherwise impossible capture. On exceeding limit, supercritical precipitates, stable at least up 1155 K, formed. The results highlight high capacity silicates store and, predict higher radiogenic due accompanying radiation damage.