Anelastic and dielectric relaxations in CuO in the temperature range 90-160 K
作者： H. M. Shen , Z. F. Zhang , P. S. Guo , Y. N. Huang , Y. N. Wang
DOI: 10.1007/BF00754744
关键词:
摘要: Internal friction and dielectric loss measurements, x-ray diffraction analysis tensile tests as a function of temperature were carried out in CuO. Data from the experiments show that no phase transition or phase-like occurs between 90 K 160 instead, this range both internal measurements display relaxation peak with an activation 0.23±0.01 eV. It is concluded behaviour high Tc superconductors > 80 not related to
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